27th January, 2021, Changchun, China – Gpixel announces the first sensor in a new family of high sensitivity and high speed CMOS line scan image sensors supporting true charge-domain time delay integration (TDI). GLT5009BSI is a backside illuminated (BSI), TDI image sensor with 5 um pixels and 9072 pixel horizontal resolution. The sensor has two photosensitive bands, 256 stages and 32 stages respectively, enabling a high dynamic range (HDR) imaging mode.
GLT5009BSI’s 5 um pixel provides a full well capacity of 16 ke- and noise of 8 e- which delivers more than 66 dB dynamic range. The GLT sensor family employs scientific CMOS BSI technology to achieve industry leading sensitivity from the ultraviolet to the near infrared.
Read out of the image data is achieved through 86 pairs of sub-LVDS channels at a combined maximum data rate of 72.58 Gbps. This output architecture supports line rates up to 600 kHz using 10-bit single band mode, 300 kHz using 12-bit single band mode.
The length of the photosensitive area is 45.36 mm and the sensor is assembled in a 269 pin uPGA package. The sensor integrates several features to ease camera integration including an internal sequencer, channel multiplexing, and selectable scan direction.
“With the launch of the first sensor in the GLT family, Gpixel is able to address a new segment of applications requiring higher speed and more sensitivity than can be achieved with existing line scan products. We are excited to bring this high-end technology to our customers enabling them to address these demanding applications,” says Wim Wuyts, CCO of Gpixel.
The GLT family’s combination of high speed and sensitivity from the UV to the NIR is ideal for applications such as flat panel display inspection, printed circuit board inspection, wafer inspection, digital pathology and fluorescence imaging.
GLT5009BSI engineering samples can be ordered today for delivery in March, 2021.