Gpixel Introduces GIR1201 and GIR2505: New SWIR Line Scan Image Sensors for Industrial Inspection

Gpixel, which Kanematsu Futuretech Solutions (KFT) serves as the distributor in Japan, announces the launch of the first two image sensors in a new family of line scan sensors sensitive in the short-wave infrared (SWIR) portion of the spectrum: GIR1201 and GIR2505. 

Both sensors offer high line rate, high dynamic range, and digital output via on-chip ADC. They are sensitive in the 900 nm to 1700 nm range and achieve a quantum efficiency (QE) of 75 % at 1550 nm. 

Figure 1. GIR1201 and GIR2505 use industry standard InGaAs technology to maximize sensitivity to SWIR wavelengths and share the same 64-pin DIP package for easy integration.  

■ Product Overview 

GIR1201 

• Resolution: 1024 × 1 (InGaAs line scan) 
• Pixel size: 12.5 μm square, global shutter 
• Dynamic range: 72 dB (12-bit ADC integrated) 
• Gain modes: High Gain (HG) / Low Gain (LG) 
  – LG mode: Full well capacity of 1.6 Me⁻ 
  – HG mode: Full well capacity of 120 ke⁻ 
• Interface: 2 pairs of Sub-LVDS (max. 1.68 Gbps) 
• Max. line frequency: 71.9 kHz 
• Power consumption: < 450 mW at max frequency 
• Package: 64-pin DIP (57.4 × 18.9 mm) 

GIR2505 

• Resolution: 512 × 2 (InGaAs line scan) 
• Pixel size: 25 μm square, global shutter 
• Dynamic range: 70 dB (12-bit ADC integrated) 
• Gain modes: High Gain (HG) / Low Gain (LG) 
  – LG mode: Full well capacity of 1.6 Me⁻ 
  – HG mode: Full well capacity of 85 ke⁻ 
• Interface: 2 pairs of Sub-LVDS (max. 1.68 Gbps) 
• Max. line frequency: 40.4 kHz 
• Power consumption: < 450 mW at max frequency 
• Package: 64-pin DIP (57.4 × 18.9 mm) 

■ Key Applications 

SWIR line scan cameras are widely used in industrial and scientific fields due to their ability to reveal features invisible in visible or near-infrared imaging: 

• Food processing, agriculture, pharmaceuticals: Moisture detection, ripeness assessment, bruise detection, pill coating inspection 
• Recycling and material sorting: Plastic type identification, organic/inorganic separation 
• Semiconductor inspection: Internal defect detection through silicon 
• Web and surface inspection: Detecting coating uniformity and structural defects in textiles, paper, films 
• Optical Coherence Tomography (OCT): Non-destructive testing of silicon wafers and semiconductor materials 

■ Comment from Gpixel 

“Gpixel continues to expand its offering of CMOS image sensors useful outside of the visible spectrum. Our portfolio can address sensing applications with wavelengths starting in the soft x-ray range,” said Wim Wuyts, CCO of Gpixel. 

“With the launch of this new family, we extend into the longer wavelengths not addressable by silicon, but where many of our industrial imaging customers have critical applications.” 

■ Availability 

Engineering samples and evaluation systems are available now. 

For inquiries, please contact us .

■ About Gpixel 

Gpixel is an international company providing high-end customized and off-the-shelf CMOS image sensor solutions for industrial, medical, scientific, and professional photography and video applications. Gpixel offers a broad portfolio of products leveraging the latest technologies to meet the ever-growing demands of the high-performance imaging market. 

Website: https://www.gpixel.com 

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